Non-destructive Testing of Planar Defects Using Shearography Method with Modulated Ultrasonic Excitation

Document Type : Original Article

Authors

1 Faculty of Mechanical Engineering, Tarbiat Modares University, Tehran, Iran.

2 Faculty of Mechanical Engineering, Tarbiat Modares University, Tehran

Abstract

Early detection of sub surface defects is very important in the maintenance and development of structures made of composite materials. Therefore , it becomes necessary to use non - destructive tests to improve system reliability and prevent untimely failure of components during operation. However , due to the multi-component nature of the configuration , its complexity , and the extent of various defects in these materials , the detection of defects in composite materials is always difficult .So , there is important to develop some new and advanced methods to detect many of defects in these types of materials . Shearography or laser shearing interferometery , with internal excitation of the defect is one of the novel methods of non - destructive testing of subsurface defects , which detects defects by receiving the defect's surface response to the loading. In this article, a glass fiber-reinforced polymer specimen was subjected to non-destructive inspection using shearography with modulated ultrasonic loading. The parameters influencing the detectability of plane defects were studied , and the obtained results were compared with the usual constant - amplitude ultrasonic loading method . In shearography tests using the amplitude modulation technique , in contrast to the constant amplitude ultrasonic loading , the defect was easily detected at all three excitation frequencies and through the phase and amplitude images . Additionally , the highest resolution of defect detection was achieved at the 43 k Hz excitation frequency . The amplitude image results showed that the defect has higher detect - ability at lower modulation frequencies, regardless of the piezoelectric stimulation frequency . Furthermore , the phase difference changes and defect detect - ability in the phase images are not significantly affected by the piezoelectric excitation frequency , demonstrating the independence of the phase image and the modulating method from the loading conditions .

Keywords

Main Subjects

References

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History

  • Receive Date: 07 November 2023
  • Revise Date: 08 March 2024
  • Accept Date: 16 March 2024

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